Dual-Beam Focused Ion Beam Rasterelektronenmikroskop

• Subject Area: Geophysics and Geodesy
• Term: Funded in 2009
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 126074464

• Final Report Year: 2016

Final Report Abstract

Die in den letzten drei Jahren mit dem neu installierten FIB System im den Bereich der Materialuntersuchung / -charakterisierung durchgeführten Projekte sind im Folgenden kurz aufgeführt. 1. Novel intermetallic BiCo compounds 2. Pillar indentation splitting / measuring fracture toughness 3. Residual stress measurements 4. Grain boundary characteristics in a tungsten crystal 5. FIB TEM lamella preparation of thermoelectric Al-doped ZnO thin films: crystal orientation and local strain mapping using ASTAR 6. Pt contacts for electrical testing ion conductors 7. TEM lamella sample preparation 8. EBSD on polycrystalline Bi-doped ZnO 9. FIB Praktika

Publications

• A novel pillar indentation splitting test for measuring fracture toughness of thin ceramic coatings, Philos. Mag., 95, 16-18 (2014) 909612 1928-44
  M. Sebastiani, K.E. Johanns, E.G. Herbert, F. Carassiti, M.G. Pharr
  
• Enhanced thermoelectric performance of Al-doped ZnO thin films on amorphous substrate, Jpn. J. Appl. Phys., 53, 6 (2014) 060306
  S. Saini, P. Mele, H. Honda, D. J. Henry, P. E. Hopkins, L. Molina- Luna, K. Matsumoto, K. Miyazaki, and A. Ichinose
  
• “Focused ion beam in situ lift-out of 2% Al-doped ZnO (AZO) thin films fabricated by pulsed laser deposition with a JEOL-JIB 4600F System,” in 9th FIB Workshop DACH Arbeitskreis FIB. Focused Ion Beams in Research Science and Technology 2014
  L. Molina-Luna, U. Kunz, M. Duerrschnabel, B. Thybusch, S. Saini, P. Mele, and H.-J. Kleebe
  
• Influence of Postdeposition Cooling Atmosphere on Thermoelectric Properties of 2% Al-Doped ZnO Thin Films Grown by Pulsed Laser Deposition,” J. Electron. Mater., 44, 6 (2015) 1547-52
  S. Saini, P. Mele, H. Honda, K. Matsumoto, K. Miyazaki, L. Molina- Luna, and P. E. Hopkins