High resolution microscopy using a scattering layer

• Applicant: Professor Dr. Wolfgang Osten
• Subject Area: Measurement Systems
• Term: from 2017 to 2021
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 326167230

Microscope objectives having good imaging quality and high resolution are expensive and bulky. At the same time, fixed focal length, working distance, limited depth of focus and magnification restrict their applicability. Aberrations are an additional challenge of classical microscope objectives. Consequently, there is a growing need for compact optical microscopy imaging systems with adjustable depth of focus, high resolution and free of aberration. The goal of the project is the development of a technique for imaging microscopic samples, where instead of a microscope objective, like in conventional microscopy, a scattering surface is applied. The image of the object will be retrieved by processing the light diffracted by the diffuser, recorded on a pixelated sensor. The newly developed microscope will deliver submicrometer resolution and aberration free images. Furthermore, it will likewise be applicable to shorter (UV, X-rays) and longer (infrared) wavelengths. The developed technique will be used for biological imaging and investigation of technical samples.

• DFG Programme: Research Grants