Laterales Wachstum von Si- und SiGe-LPE Schichten auf strukturierten Substraten

• Applicant: Privatdozent Dr. Michael Hanke
• Subject Area: Mineralogy, Petrology and Geochemistry
• Term: from 2005 to 2009
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 5446216

• Final Report Year: 2009

Final Report Abstract

No abstract available

Publications

• Analysis of epitaxial laterally overgrown silicon structures by high resolution xray rocking curve imaging. Cryst. Res. Technol. 44 (2009) 534
  B. Heimbrodt, D. Lübbert, R. Köhler, T. Boeck, A.-K. Gerlitzke, and M. Hanke