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Streulichtsimulation der Total Internal Reflection Microscopy (TIRM) Messtechnik

Subject Area Experimental Condensed Matter Physics
Term from 2005 to 2007
Project identifier Deutsche Forschungsgemeinschaft (DFG) - Project number 5439323
 
Final Report Year 2007

Final Report Abstract

To summarise this report we like to outline the most important goals achieved during the first part of the project: • Both DSM and NFM-DS were extended to simulate TIRM calibration curves. • The simulation tools were validated by comparing of the simulation results to each other. There was a good agreement. • The simulation methods were validated by comparing to measurement results. Close agreement was achieved. • We were able to demonstrate that oscillations in TIRM calibration curve were caused by particle-prism scattering interaction. • The DSM TIRM model has been extended to coated spheres and a multi-layered plane interface.

Publications

  • Analysis of Evanescent Waves Scattering by a Single Particle in Total Internal Reflection Microscopy. Progress In Electromagnetics Research Symposium (PIERS) Proceedings, March 26-29, 2006, Cambridge, USA, 447-449
    E. Eremina, T. Wriedt and L. Helden
  • Evanescent wave scattering modeling for total internal reflection microscopy. Proc. of 9th Electromagnetic and light scattering conference, St. Petersburg, Russia, 2006, June 5-9, 35-38
    E. Eremina, N. Riefler, T. Wriedt and L. Helden
  • Mathematical models in biophotonics problems. Moscow University Comput. Math. Cybernetics 3 (2006), 175-189 (in Russian)
    Yu.A. Eremin, A.G. Sveshnikov
  • Simulation der TIRM Messtechnik zur Messung ultrakleiner Kräfte. VDI-GVC Fachausschusssitzung "Partikelmesstechnik", 13./14.2.2006, Clausthal-Zellerfeld
    Th. Wriedt
  • Simulations of light scattering spectra of a nanoshell on plane interface based on the Discrete Sources Method. Opt. Comm. 267 (2) (2006), 524-529
    E. Eremina, Y. Eremin, T. Wriedt
  • Single particle evanescent light scattering simulations for total internal reflection microscopy. Appl. Optics, 45 (2006), 7299-7308
    L. Helden, E. Eremina, Y. Eremin, N. Riefler, C. Hertlein, C. Bechinger, T. Wriedt
  • Total Internal Reflection Microscopy with multilayered interface: Light scattering model based on Discrete Sources Method. J. Opt. A: Pure Appl. Opt. 8 (2006), 999- 1006
    E. Eremina, N. Grishina, Y. Eremin, L. Helden, T. Wriedt
  • Analysis of Scattering Characteristics of Local Biosensors. Optics and spectroscopy, 102 (3) (2007), 461-466
    N.V. Grishina, Yu.A. Eremin, A.G. Sveshnikov
  • Comparison of T-matrix method with Discrete Sources Method on the basis of Total Internal Reflection Microscopy Measurements. JQSRT 106 (1-3), (2007), 464-474
    N. Riefler, E. Eremina, C. Hertlein, L. Helden, Y. Eremin, T. Wriedt
  • Interaction force measurement using Total Internal Reflection Microscopy (TIRM) and exact light scattering simulation results. 8th International Congress on Optical Particle Characterization, 9-13 July 2007, Karl-Franzens University Graz, Austria
    Thomas Wriedt, Norbert Riefler, Elena Eremina, Christopher Hertlein, Laurent Helden, Clemens Bechinger, Yuri Eremin
  • Mathematical models in nanooptics and biophotonics problems on the base of Discrete Sources Method. Comput. Maths. Math. Phys. 47 (2) (2007), 266-284 (in Russian)
    Yu.A. Eremin, A.G. Sveshnikov
 
 

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