Scanning Transmission Electron Microscope

• Subject Area: Materials Science
• Term: Funded in 2019
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 424832238

The Funding Priority "Kiel Nano, Surface and Interface Science (KiNSIS)" of the CAU Kiel as well as the associated Excellence Clusters, Graduate Schools and Collaborative Research Centers focus on recent (nano) materials and are consequently not feasible without electron microscopy. The currently in Kiel installed scanning (SEM) and transmission (TEM) electron microscopes are only applicable for preliminary and routine measurements, because of the limited performance as well as the matter of fact that they do not comply with the state of the art anymore. The interdisciplinary projects demand a substantial amount of chemical and structural nanoscopic analyses on such high level which can be achieved only via a modern microscope. With the present proposal an aberration-corrected scanning TEM (STEM) should be purchased for the first time in Kiel which significantly expands the experimental possibilities, e. g. by atomic-number dependent (Z-contrast) micrographs as well as by chemical analyses close to atomic resolution by means of a state-of-the-art X-ray detector (EDX) and electron energy loss spectroscopy (EELS).

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: 200kV Raster-Transmissionselektronenmikroskop (Teilfinanziert)
• Instrumentation Group: 5100 Elektronenmikroskope (Transmission)
• Applicant Institution: Christian-Albrechts-Universität zu Kiel
• Leader: Professor Dr. Lorenz Kienle